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1

Effects of local Joule heating on the reduction of contact resistance between carbon nanotubes and metal electrodes

Dong, Lifeng, Youkey, Steven, Bush, Jocelyn, Jiao, Jun, Dubin, Valery M., Chebiam, Ramanan V.

Journal:

Journal of Applied Physics

Year:

2007

Language:

english

File:

PDF, 856 KB

english, 2007

2

Electrochemical materials and processes in Si integrated circuit technology

V.M. Dubin, R. Akolkar, C.C. Cheng, R. Chebiam, A. Fajardo, F. Gstrein

Journal:

Electrochimica Acta

Year:

2007

Language:

english

File:

PDF, 1.07 MB

english, 2007

3

[IEEE 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM) - Grenoble, France (2015.5.18-2015.5.21)] 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM) - Simple test vehicle for metal fill and resistance of sub-8nm nanowire

Sung, Seung Hoon, Chawla, Jasmeet, Carver, Colin, Chebiam, Ramanan, Clarke, James, Jezewski, Chris, Tronic, Tristan, Turkot, Bob, Yoo, Hui Jae

Year:

2015

File:

PDF, 408 KB

2015

4

Comparison of the Chemical Stability of Li1−xCoO2 and Li1−xNi0.85Co0.15O2 Cathodes

R.V. Chebiam, F. Prado, A. Manthiram

Journal:

Journal of Solid State Chemistry

Year:

2002

Language:

english

File:

PDF, 303 KB

english, 2002

5

Comparison of the chemical stability of the high energy density cathodes of lithium-ion batteries

R.V Chebiam, A.M Kannan, F Prado, A Manthiram

Journal:

Electrochemistry Communications

Year:

2001

Language:

english

File:

PDF, 155 KB

english, 2001

6

Mechanical properties of high porosity low- k dielectric nano-films determined by Brillouin light scattering

Bailey, S, Mays, E, Michalak, D J, Chebiam, R, King, S, Sooryakumar, R

Journal:

Journal of Physics D Applied Physics

Year:

2013

Language:

english

File:

PDF, 482 KB

english, 2013

7

Soft Chemistry Synthesis and Characterization of Layered Li 1- x Ni 1- y Co y O 2-δ (0 ≤ x ≤ 1 and 0 ≤ y ≤ 1)

Chebiam, R. V., Prado, F., Manthiram, A.

Journal:

Chemistry of Materials

Year:

2001

Language:

english

File:

PDF, 126 KB

english, 2001

8

Structural Instability of Delithiated Li[sub 1−x]Ni[sub 1−y]Co[sub y]O[sub 2] Cathodes

Chebiam, R. V., Prado, F., Manthiram, A.

Journal:

Journal of The Electrochemical Society

Year:

2001

Language:

english

File:

PDF, 295 KB

english, 2001

9

International Radar Conference

Manthiram, A., Chebiam, R.V., Prado, F.

Journal:

IEEE Transactions on Aerospace and Electronic Systems

Year:

1975

Language:

english

File:

PDF, 2.31 MB

english, 1975

10

[IEEE Sixteenth Annual Battery Conference on Applications and Advances. - Long Beach, CA, USA (9-12 Jan. 2001)] Sixteenth Annual Battery Conference on Applications and Advances. Proceedings of the Conference (Cat. No.01TH8533) - Layered cobalt and nickel oxide cathodes: a comparison of their structural and chemical stabilities

Manthiram, A., Chebiam, R.V., Prado, F.

Year:

2001

Language:

english

File:

PDF, 458 KB

english, 2001

11

[IEEE 2014 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC) - San Hose, CA, USA (2014.5.20-2014.5.23)] IEEE International Interconnect Technology Conference - Demonstration of a sidewall capacitor to evaluate dielectrics and metal barrier thin films

Lin, Kevin L., Carver, Colin T., Chebiam, Ramanan, Clarke, James, Faber, Jacob, Harmes, Michael, Indukuri, Tejaswi, Jezewski, Christopher, Kobrinsky, Mauro, Krist, Brian, Lakamraju, Narendra, Lang, Ha

Year:

2014

Language:

english

File:

PDF, 562 KB

english, 2014

12

[IEEE 2013 IEEE International Interconnect Technology Conference - IITC - Kyoto, Japan (2013.06.13-2013.06.15)] 2013 IEEE International Interconnect Technology Conference - IITC - Demonstration of a 12 nm-half-pitch copper ultralow-k interconnect process

Chawla, J. S., Chebiam, R., Akolkar, R., Allen, G., Carver, C. T., Clarke, J. S., Gstrein, F., Harmes, M., Indukuri, T., Jezewski, C., Krist, B., Lang, H., Myers, A., Schenker, R., Singh, K. J., Turko

Year:

2013

Language:

english

File:

PDF, 1.01 MB

english, 2013

13

Effects of Dielectrophoretic Parameters on Fabrication and Electronic Properties of Single-Walled Carbon Nanotube Devices

Dong, Lifeng, Youkey, Steven, Bush, Jocelyn, Lo, Jennifer, Jiao, Jun, Dubin, Valery M, Chebiam, Ramanan V

Journal:

MRS Proceedings

Year:

2005

Language:

english

File:

PDF, 790 KB

english, 2005

14

[ECS 209th ECS Meeting - Denver, Colorado (May 7-May 12, 2006)] ECS Transactions - Advanced Electrochemical Processes for Sub-50 nm On-chip Metallization

Akolkar, Rohan, Cheng, Chin-Chang, Chebiam, Ramanan, Fajardo, Arnel, Dubin, Valery

Year:

2007

Language:

english

File:

PDF, 472 KB

english, 2007

15

[IEEE 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM) - Grenoble, France (2015.5.18-2015.5.21)] 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM) - Demonstration of new planar capacitor (PCAP) vehicles to evaluate dielectrics and metal barrier thin films

Lin, Kevin L., Bielefeld, Jeffrey, Chawla, Jasmeet S., Carver, Colin T., Chebiam, Ramanan, Clarke, James S., Faber, Jacob, Harmes, Michael, Indukuri, Tejaswi, Jezewski, Christopher, Kasim, Rahim, Kobr

Year:

2015

File:

PDF, 744 KB

2015

16

Morphology and Field Emission Characteristics of Carbon Nanotubes Grown using Pt Catalysts

Hedberg, James, Jiao, Jun, Dubin, Valery, Dominguez, Juan, Chebiam, Ramanan

Journal:

Microscopy and Microanalysis

Year:

2004

Language:

english

File:

PDF, 473 KB

english, 2004

17

Chemical Synthesis and Properties of Layered Co1-yNiyO2-δOxides (0≤y≤1)

Manthiram, A., Chebiam, R. V., Prado, F.

Journal:

MRS Proceedings

Year:

2000

Language:

english

File:

PDF, 112 KB

english, 2000

18

[IEEE 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC) - San Jose, CA, USA (2016.5.23-2016.5.26)] 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC) - Resistance and electromigration performance of 6 nm wires

Chawla, J. S., Sung, S. H., Bojarski, S. A., Carver, C. T., Chandhok, M., Chebiam, R. V., Clarke, J. S., Harmes, M., Jezewski, C. J., Kobrinski, M. J., Krist, B. J., Mayeh, M., Turkot, R., Yoo, H. J.

Year:

2016

Language:

english

File:

PDF, 638 KB

english, 2016